Compare path bandwith control for high performance automatic test systems

A circuit for high performance automatic test systems, comprising:

• a first device with a plurality of input terminals and at least one output terminal;
• a second device with a plurality of input terminals and at least one output terminal;
• a first programmable voltage source connected to a first of said plurality of input terminals of said first device;
• a second programmable voltage source connected to a first of said plurality of input terminals of said second device;
• an input signal terminal connected to a second of said plurality of input terminals of said first device and a second of said plurality of input terminals of said second device;
• a third device with an input terminal connected to a first output terminal of said first device and at least one output terminal;
• a fourth device with a first input terminal connected to a second output terminal of said first device, a second input terminal connected to a first output terminal of said second device, and at least one output terminal;
• a fifth device with a first input terminal connected to a first output of said third device and at least one output terminal;
• a sixth device with a first input terminal connected to said first output of said third device, a second input terminal connected to a first output terminal of said fourth device, and at least one output terminal;
• a seventh device with a first input terminal connected to said first output terminal of said fourth device and at least one output terminal;
• and
• an eighth device with a first input terminal connected to a first output terminal of said fifth, a second input terminal connected to a first output terminal of said sixth device, and at least one output terminal.