US 6,617,841 B2 · Method and apparatus for characterization of electronic circuitry

Abstract

The present invention is a method and apparatus for characterization of electronic circuitry. Electronic systems rely on correct circuitry to function properly. Thus, a testing process is utilized to ensure correctness of circuitry. Some testing methods require multiple steps to test connectivity and correctness of circuitry. These methods are inefficient in some applications. The present invention improves efficiency of the testing process of some electronic systems. One embodiment of the present invention injects a known current into a circuit at a test point by providing a known voltage across a known resistance. The voltage at the test point is measured and the circuit is characterized by a plot of the known voltage minus the measured voltage with respect to the measured voltage. One embodiment is used to improve efficiency in testing advanced functional testers. Since a circuit is characterized by the embodiment contacting one test point, continuity and integrity from each connector pin are tested simultaneously. Thus, the need for a shorting board test is eliminated. Other embodiments are used to test other electrical systems.

Drawings

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Drawings

Claims20

Dependent claims

A method for circuit characterization comprising:

injecting a plurality of known voltages into a circuit at a first test point;
sending said plurality of known voltages to a positive input of a voltage subtractor;
measuring a plurality of measured voltages across said first test point and a second test point having a common voltage;
sending said plurality of measured voltages to a first output;
sending said plurality of measured voltages to a negative input of said voltage subtractor;
obtaining a plurality of differences between said plurality of known voltages and said plurality of measured voltages at said voltage subtractor;
sending said plurality of differences to a second output;
coupling said first and second outputs to an oscilloscope;
plotting a graph of said plurality differences with respect to said plurality of measured voltages on said oscilloscope;
and
determining a characteristic of said circuit based on said graph.

8 more elements

Dependencies are inferred from the claim text.

Description2,489 words

Summary1,317 words

#1. Field of the Invention

#The present invention relates to circuit board testing equipment and more specifically to a method and apparatus for testing integrity of electronic circuits.

#2. Background Art

Brief description of the drawings9 figures

#These and other features, aspects and advantages of the present invention will become better understood with regard to the following description, appended claims and accompanying drawings where:

#FIG. 1 is a block diagram of an advanced functional tester.

#FIG. 2 is a flow diagram of a prior art method for testing advanced functional testers.

Detailed description998 words

#The invention is a method and apparatus for characterization of electronic circuitry. En the following description, numerous specific details are set forth to provide a more thorough description of embodiments of the invention. It is apparent, however, to one skilled in the art, that the invention may be practiced without these specific details. In other instances, well known features have not been described in detail so as not to obscure the invention.

#Characterization Tool

#FIG. 6 illustrates one embodiment of the present invention. The characterization tool (600) has a test voltage input (605). The test voltage input, resistor 1 (610) and resistor 2 (615) are coupled together. Resistor 1, test probe 1 (620), resistor 3 (625) and output 1 (630) are coupled together. Resistor 2, resistor 4 (635) and the positive input of the voltage subtracter (640) are coupled together. Resistor 3, the negative input of the voltage subtractor and resistor 5 (645) are coupled together. Test probe 2 (650) couples to the common voltage (ground) (655). Resistor 4 couples to the common voltage (ground) (660). Resistor 5, the output of the voltage subtractor and output 2 (665) are coupled together.

Facts

Application

09/741,123Filed 19 Dec 2000

Published

US 2002/0074992 A120 Jun 2002

Granted

9 Sep 2003

Term ended

4 Feb 2021

Estimated · how

20 years from earliest known nonprovisional domestic filing plus recorded patent term adjustment, including 47 days of adjustment. Maintenance-fee lapses, terminal disclaimers and statutory extensions have not been checked. The continuity chain may be incomplete; this is not an enforceability determination.

Classification2 codes

G06F 11/24
Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing: marginal…
G06F
Computing and data processing

Method and apparatus for characterization of electronic circuitry

Life of this patent

Method and apparatus for characterization of electronic circuitry

Life of this patent

Life of this patent

Abstract

Drawings

Drawings

Claims20

Description2,489 words

Drawings

Description2,489 words

Classification2 codes

Life of this patent