Method of forming a test insert for interfacing a device containing contact bumps with a test substrate
AssigneeMicron Technology, Inc.
InventorsSalman Akram, David R. Hembree
Life of this patent
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AssigneeMicron Technology, Inc.
InventorsSalman Akram, David R. Hembree
Estimating the term…
An insert is provided for testing a chip-scale-packaged microelectronic device having an encapsulant-protrusion and a ball-grid-array of outwardly-projecting contacts. The insert comprises a substrate of mono-crystalline silicon. Walls of the substrate define a plurality of pockets that are configured to receive and contact the outwardly-projecting contacts of the microelectronic device. Additional walls of the substrate define a recess disposed amongst the plurality of pockets. The recess has a width greater than the widths of any of the pockets. Additionally, the recess comprises a perimeter greater than that of the encapsulant-protrusion of the chip-scale-packaged microelectronic device, and a depth operative to clear the encapsulant-protrusion when the chip-scale package is seated upon the insert.
A method for making an insert for electrically interfacing an electronic device to a support substrate, the electronic device containing a plurality of contact bumps and a protrusion, the support substrate containing a plurality of conductive members, the insert having first and second sides, the method comprising:
A method for making an insert for electrically interfacing an electronic device to a support substrate, the electronic device containing a plurality of contact bumps and a protrusion, the support substrate containing a plurality of conductive members, the insert having first and second sides, the method comprising:
Dependencies are inferred from the claim text.