Thermal performance in flip chip/integral heat spreader packages using low modulus thermal interface material
AssigneeIntel Corporation
InventorsVassoudevane Lebonheur, Robert Starkston
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AssigneeIntel Corporation
InventorsVassoudevane Lebonheur, Robert Starkston
Estimating the term…
A microprocessor package and a method of dissipating heat therefrom have improved thermal performance by utilizing low modulus thermal interface material between the flip chip, central processing unit and a heat spreader in the package. A modulus of elasticity of the thermal interface material in the kPa range is preferably provided by a cured, filled polymer gel which is lightly crosslinked. The gel thermal interface material enables the package to have a post end-of-line and post reliability testing thermal resistance across the thermal interface material between the flip chip and the heat spreader of <0.45 cm2° C./Watt. Mitigation of thin film cracking in die and prevention of interfacial delamination upon temperature cycling are also attained.
A semiconductor die package comprising:
A semiconductor die package comprising:
A method of making a semiconductor die package comprising:
A method of making a semiconductor die package comprising:
A method of dissipating heat from a semiconductor die package comprising:
A method of dissipating heat from a semiconductor die package, comprising:
A microprocessor package comprising:
Dependencies are inferred from the claim text.