US 6,616,332 B1 · Optical techniques for measuring parameters such as temperature across a surface

Abstract

A sensor of a parameter such as temperature includes an indicator encapsulated within a rigid enclosure, wherein the sensor has a characteristic that varies with the parameter that is detectable upon illumination with electromagnetic radiation through a window of the enclosure that is transparent to the radiation. In a specific example, the indicator changes an optical characteristic such as its color as a function of its temperature, and may be of an irreversible type in order to indicate the peak temperature reached. The sensor may include a pattern of such indicators that have different peak temperatures to which they respond, so that the sensor gives a unique visual pattern at each temperature within its measurement range. This pattern may be viewed directly or processed by computer to compare the pattern with those which indicate known temperatures. The sensor and system utilizing it have particular advantages for operation in a vacuum, and/or under ion bombardment, such occurs in plasma etching and deposition machines, and/or within a strong electromagnetic field, such as within the radio frequency and microwave frequency ranges. An array of such sensors positioned across a surface of a thermally conductive substrate is especially useful for measuring a temperature distribution occurring across semiconductor wafers in wafer processing machinery.

Claims19

Dependent claims

A method of testing the temperature distribution imparted on a semiconductor wafer during processing within a plasma processing chamber, comprising:

providing a test substrate having a plurality of temperature sensors positioned across one surface thereof, wherein each of the plurality of sensors includes a plurality of optical indicators of a plurality of different peak temperatures sealed in at least one compartment of a thermally conductive enclosure having a rigid optically transparent window facing out away from the substrate surface,
positioning the test substrate with the plurality of sensors within the plasma processing chamber,
thereafter operating the plasma processing chamber in a vacuum and in a manner corresponding to its operation when processing semiconductor wafers, wherein the optical indicators are sealed within said at least one compartment of the sensors sufficiently for the plurality of different peak temperatures of the optical indicators to be substantially unaffected by a pressure difference experienced by the test substrate,
thereafter removing the test substrate from the plasma processing chamber, and
thereafter observing through the windows of the sensors patterns of optical characteristics of the indicators therein, thereby to determine peak temperatures reached by the test substrate at the positions of the sensors.

2 more elements

A temperature measurement system, comprising:

a substrate, and
a plurality of temperature sensors positioned at spaced apart locations across at least one surface of the substrate, the temperature sensors individually including:
a plurality of channels formed adjacent one another into said at least one substrate surface with portions of the substrate remaining as walls between the channels,
a rigid thermally conductive and visible radiation transparent cover attached to said at least one surface adjacent the channels and to tops of the walls between them in a manner to seal the tops of the channels,
a plurality of indicators attached to bottom surfaces of the channels with spaces between top surfaces of the indicators and an underside of the cover, the indicators individually having a physical characteristic that visibly changes in an abrupt and irreversible manner as the sensor is raised above a threshold temperature that is different from threshold temperatures wherein the physical characteristic of other indicators visibly change, the indicators being arranged within the channels of the individual sensors to form visible patterns for the plurality of sensors that are unique for individual ones of the threshold temperatures,
wherein the plurality of channels are individually elongated in a common direction and arranged with their long sides positioned adjacent one another, the walls being positioned between the channels along their long sides, and
wherein a plurality of indicators are positioned in individual ones of the plurality of channels along their lengths, thereby to arrange the indicators within the individual sensors with their unique visible patterns in two-dimensions.

4 more elements

A temperature measurement system, comprising:

a substrate, and
a plurality of temperature sensors positioned at spaced apart locations across at least one surface of the substrate, the temperature sensors individually including:
a cavity formed into said at least one surface of the substrate, wherein the cavity is formed of a plurality of channels arranged adjacent one another with portions of the substrate remaining as walls between the channels,
a rigid thermally conductive and visible radiation transparent cover attached to the substrate in a manner to seal the cavity, and
a plurality of indicators attached to a bottom surface of the cavity with spaces between top surfaces of the indicators and an underside of the cover, the indicators individually having a physical characteristic that visibly changes in an abrupt and irreversible manner as the sensor is raised above a threshold temperature that is different from threshold temperatures wherein the physical characteristic of other indicators visibly change, the indicators being arranged within the sensor cavity to form visible two-dimensional patterns among the plurality of sensors that are unique for individual ones of the threshold temperatures, and wherein a plurality of the indicators are positioned in individual ones of the plurality of channels.

2 more elements

Dependencies are inferred from the claim text.

Optical techniques for measuring parameters such as temperature across a surface

Life of this patent

Optical techniques for measuring parameters such as temperature across a surface

Life of this patent

Abstract

Claims19