Inspection system and method for manufacturing electronic devices using the inspection system

An inspection system comprising:

• an inspection machine for inspecting a work which is processed in a manufacturing process;
• and
• an analysis system for displaying a matrix of first information as to inspection processes in which the work is inspected or manufacturing processes corresponding to the inspection processes in which the work is inspected and second information as to the work inspected by the inspected machine.

An inspection system comprising:

• an inspection machine for inspecting a work which is processed in a manufacturing process;
• and
• an analysis system for displaying both inspection processes in which the work is inspected and inspection processes in which the work is not inspected or both manufacturing processes corresponding to the inspection processes in which the work is inspected and manufacturing processes corresponding to the inspection processes in which the work is not inspected.

An analysis system comprising:

• storing means for storing inspection results of an inspected work;
• and
• outputting means for outputting an inspection history list calculated by using said stored inspection results, said inspection history list showing a matrix of first information as to inspection processes in which the work is inspected or manufacturing processes corresponding to the inspection processes in which the work is inspected and second information as to the work inspected by the inspected machine.