X-ray examination apparatus

An X-ray examination apparatus, comprising:

• an X-ray source,
• an X-ray detector,
• a filter arranged between said source and said detector, said filter comprising an array of filter elements having X-ray absorbtivities that can be adjusted by means of control voltages,
• a control circuit for supplying said control voltages to said filter elements,
• an object support arranged between said filter and said detector, said station being adapted to support an object to be exposed to X-ray radiation emanating from said source, the transmitted X-ray radiation being detected by said detector, and
• a signal processing assembly receiving detector signals from said X-ray detector, said detector signals being group-wise arranged in accord with the supply of said control voltages to groups of adjacent filter elements,
• said control circuit being adapted to supply said control voltages in single-sequence fashion to said groups of adjacent filter elements.