Nanometer-order mechanical vibrator, production method thereof and measuring device using it
AssigneeJapan Science and Technology Corporation
InventorsHideki Kawakatsu, Hiroshi Toshiyoshi
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AssigneeJapan Science and Technology Corporation
InventorsHideki Kawakatsu, Hiroshi Toshiyoshi
Estimating the term…
There are provided a stable and highly sensitive nanometric mechanical oscillator having a considerably high detection resolution that enables detection of variation in force or mass on the nanometer order, as well as a method of fabricating the same, and a measurement apparatus using the same. A nanometric mechanical oscillator (10) includes a base (11), a tetrahedral oscillator mass (13); and an elastic neck portion (12) for connecting the base (11) and the tetrahedral oscillator mass (13). The oscillator (10) assumes a mushroom-like shape and has a nanometric size. The oscillator mass (13) assumes a tetrahedral shape and is suitable to be used as a probe of a scanning forth microscope in which the oscillator mass (13) serving as a probe is caused to approach to an arbitrary sample surface in order to observe the surface state.
A nanometric mechanical oscillator comprising:
A method of fabricating a nanometric mechanical oscillator, comprising:
A measurement apparatus comprising:
A nanometric mechanical oscillator comprising:
A method of fabricating a nanometric mechanical oscillator, comprising:
A measurement apparatus comprising:
A measurement apparatus comprising:
A measurement apparatus comprising:
A measurement apparatus comprising:
A measurement apparatus comprising:
A measurement apparatus comprising:
A measurement apparatus comprising:
A measurement apparatus comprising:
A measurement apparatus comprising:
A measurement apparatus comprising:
A measurement apparatus comprising:
A measurement apparatus comprising:
A method of fabricating a nanometric mechanical oscillator, comprising:
A nanometric mechanical oscillator including an element which comprises a first layer formed of a piezo substrate and having a surface-acoustic-wave generation unit;
A measurement apparatus comprising:
A nanometric mechanical oscillator, wherein surface-acoustic-wave generation units are disposed along four sides of a piezo substrate;
A nanometric mechanical oscillator comprising:
A nanometric mechanical oscillator comprising a cantilever which projects from a base, is mainly formed of a plastic containing magnetic powder, and is magnetized in a direction intersecting an axial direction of the cantilever.
A nanometric mechanical oscillator comprising a cantilever which projects from a base and is mainly formed of a plastic containing whisker crystals arranged along an axial direction of the cantilever.
A nanometric mechanical oscillator comprising:
A nanometric mechanical oscillator comprising:
A nanometric mechanical oscillator comprising a triangular-pyramidal probe formed on an insulating film on a semiconductor substrate such that the probe projects outward in an overhung state.
A nanometric mechanical oscillator comprising a parallel-spring supported portion including two triangular-pyramidal probes which are formed on a semiconductor substrate such that the probes project inward in an overhung state and are connected to each other.
A nanometric mechanical oscillator comprising a parallel-spring supported portion including a probe assuming the form of a triangular prism projecting from a semiconductor substrate.
A nanometric mechanical oscillator comprising a parallel-spring supported portion including a mass formed on a semiconductor substrate and assuming the shape of a truncated rectangular pyramid.
Dependencies are inferred from the claim text.