Data corruption testing technique for a hierarchical storage system
AssigneeHewlett-Packard Development Company, L.P.
InventorBrian L. Patterson
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Abstract
A storage system is described that includes a controller and a disk array. The disk array includes at least a first and a second storage area. The first storage area is associated with a first mean time to failure (MTTF) and the second storage area is associated with a second MTTF. The controller operates to test the first storage area at a first frequency and the second storage area at a second frequency. The first frequency and the second frequency are each based upon the first and second MTTF so as to optimize the overall reliability of the storage system.
Claims20
A method of testing a data storage system for corrupt data, the system including a first data storage area associated with a first mean time to failure (MTTF) and a second data storage area associated with a second MTTF, the method comprising:
- (a) testing the first storage area for a first amount of time;
- (b) testing the second storage area for a second amount of time;
- (c) wherein the first amount of time is calculated using the first MTTF.
A data storage system, comprising:
- (a) a first data storage area associated with a first MTTF;
- (b) a second data storage area associated with a second MTTF;
- and
- (c) means for testing the first data storage area for data corruption at a first frequency;
- (d) wherein the first frequency is a precalculated value;
- and
- (e) wherein the first frequency is pre-calculated using the second MTTF.
A data storage system, comprising:
- (a) a first data storage area associated with a first MTTF;
- (b) a second data storage area associated with a second MTTF;
- (c) a controller operative to receive I/O commands from an external host and to coordinate data transfers between the external host and the first and the second data storage areas;
- and
- (d) wherein the controller is further operative to test the first storage area for corruption at a first pre-defined frequency;
- (e) wherein the first pre-defined frequency is calculated using the first MTTF and the second MTTF.
Dependencies are inferred from the claim text.