Apparatus and method for allowing testing of semiconductor devices at different temperatures
AssigneeAmkor Technology, Inc.
InventorsDaniel R. Adney, Ignacio A. Mendiola, Jr.
Life of this patent
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Abstract
An apparatus and method for maintaining a uniform temperature to allow for the environmental testing of an integrated circuit. A contactor assembly is used for connecting the integrated circuit to a piece of testing equipment. The contactor assembly is able to altering a temperature of the integrated circuit. A porting assembly is coupled to the testing equipment and to the contactor assembly. The porting assembly transfers a gas to the contactor assembly in order to allow the contactor assembly to alter the temperature of the integrated circuit.
Claims20
An apparatus to be mounted on a piece of testing equipment to allow environmental testing of an integrated circuit, comprising:
- a contactor assembly for connecting the integrated circuit to the testing equipment and for altering a temperature of the integrated circuit;
- and
- a porting assembly coupled to the testing equipment and to the contactor assembly for transferring a gas to the contactor assembly to alter the temperature of the integrated circuit wherein the porting assembly comprises:
- a porting tray coupled to the testing equipment;
- and
- a porting insert coupled to the porting tray for coupling the contactor assembly to the porting tray, wherein the porting insert comprises:
- a plate;
- an opening within and through the plate;
- and
- a plurality of channels running from an edge of the plate to the opening for transferring the gas to the contactor assembly to alter the temperature of the integrated circuit.
An apparatus to be mounted on a piece of testing equipment to allow environmental testing of an integrated circuit, comprising:
- means for connecting the integrated circuit to the testing equipment and for altering a temperature of the integrated circuit;
- and
- means coupled to the testing equipment and to the means for connecting for transferring a gas to the means for connecting to alter the temperature of the integrated circuit;
- wherein the means for connecting further comprises:
- a contactor plate having an internal void area wherein the gas is transferred from the means for transferring into the internal void area;
- means within the void area for making contact between the integrated circuit and the testing equipment and for altering the temperature of the integrated circuit;
- means coupled to a top surface of the contactor plate for holding the integrated circuit;
- and
- a plurality of channels on at least one edge of the contactor plate wherein the plurality of channels are coupled to the means for transferring and the internal void area for transferring the gas from the means for transferring to the internal void area.
A method for the environmental testing of an integrated circuit mounted on a test board comprising:
- providing a contactor assembly for connecting the integrated circuit to the testing equipment and for altering a temperature of the integrated circuit;
- providing a porting assembly coupled to the testing equipment and to the contactor assembly for transferring a gas to the contactor assembly to alter the temperature of the integrated circuit wherein the porting assembly comprises:
- a porting tray coupled to the testing equipment;
- and
- a porting insert coupled to the porting tray for coupling the contactor assembly to the porting tray, wherein the porting insert comprises:
- a plate;
- an opening within and through the plate;
- and
- a plurality of channels running from an edge of the plate to the opening for transferring the gas to the contactor assembly to alter the temperature of the integrated circuit;
- altering a temperature of the contactors to change a temperature of the integrated circuit;
- and
- testing the integrated circuit.
Dependencies are inferred from the claim text.