Network analyzer using time sequenced measurements
AssigneeTektronix, Inc.
InventorLinley F. Gumm
Life of this patent
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AssigneeTektronix, Inc.
InventorLinley F. Gumm
Estimating the term…
A network analyzer using time sequenced measurements has a pair of switches for isolating respective mixers from a local oscillator source to ease problems caused by direct leakage from the signal source. The signal source is set to a desired measurement frequency and a local oscillator is set to a desired frequency so that, when mixed, a desired IF frequency is achieved. The signal source output is applied to a return loss bridge, to which also is coupled a device under test, and to a reference channel mixer. A return loss signal from the return loss bridge is applied to a test channel mixer. The LO output is applied in a time sequence via an LO switch first to the reference channel mixer and then to the test channel mixer. An output switch couples the respective mixers to a processor in the same time sequence to provide sequential measurements of magnitude and phase from which reflection coefficients are derived for the device under test. Likewise gain/loss measurements may be made by coupling the device under test between the impedance test port and a transmission test port, the transmission test port also being coupled to a transmission channel mixer to which also is input the LO output via the LO switch in the time sequence. The output of the transmission channel mixer is coupled via the output switch to the processor to obtain the gain/loss measurements.
A network analyzer of the type having a variable frequency signal source applied to a return loss bridge and a reference channel mixer, the reference channel mixer having a variable local oscillator signal input so that the output of the reference channel mixer is at a desired IF frequency, having a test channel mixer coupled to receive a return loss signal from the return loss bridge and the variable local oscillator signal so that the output of the test channel mixer is at the desired IF frequency, and having means for processing the IF frequencies from the reference and test channel mixers to obtain RF measurements for a device under test coupled to the impedance test port further comprising:
A method of making RF measurements for a device under test comprising the steps of:
A method of making RF measurements for a device under test comprising the steps of:
Dependencies are inferred from the claim text.