US 6,608,313 B2Granted

Methods and devices for achieving alignment of a beam-propagation axis with a center of an aperture in a charged-particle-beam optical system

AssigneeNikon Corporation

InventorHiroyasu Simizu

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Abstract

Methods and devices are disclosed for aligning a beam-propagation axis with the center of an aperture, especially an aperture configured to limit the aperture angle of the charged particle beam. In an exemplary method, an alignment-measurement aperture is provided at an imaging plane of a charged-particle-beam (CPB) optical system, and a beam detector is downstream of the alignment-measurement aperture. A scanning deflector is energized to cause the beam to be scanned in two dimensions, transverse to an optical axis, over the aperture. Meanwhile, the beam detector obtains an image of beam intensity in the two dimensions. In the image a maximum-intensity point is identified, corresponding to the propagation axis. Based on the two-dimensional image, the beam is deflected as required to align the propagation axis with the aperture center.

Claims9

Dependent claims

In a charged-particle-beam (CPB) microlithography method in which a charged-particle illumination beam, propagating from a beam source and having a respective propagation axis, is passed through an illumination-optical system that includes a lens, a deflector, and an aperture-angle-limiting aperture, a method for aligning the propagation axis of the illumination beam with a center of the aperture-angle-limiting aperture, the method comprising:

(a) providing a projection-optical system that forms an image of the aperture-angle-limiting aperture at an imaging plane;
(b) providing an alignment-measurement aperture situated at the imaging plane, and a beam detector situated downstream of the alignment-measurement aperture;
(c) providing a scanning deflector upstream of the alignment-measurement aperture, the scanning deflector being configured to impart a deflection in two dimensions to an imaging beam formed of a portion of the illumination beam passing through the aperture-angle-limiting aperture and having a propagation axis, the deflection being transverse to the propagation axis of the imaging beam;
(d) energizing the scanning deflector so as to cause the imaging beam to be deflected in the two dimensions over the alignment-measurement aperture, while using the beam detector to obtain an image of beam intensity of the imaging beam passing through the alignment-measurement aperture, as distributed over the two dimensions;
(e) in the image of beam intensity, identifying a point of maximum intensity corresponding to the propagation axis of the imaging beam;
and
(f) based on the two-dimensional image obtained in step (d), energizing the deflector in the illumination-optical system as required to align the propagation axis of the imaging beam with a center of the aperture-angle-limiting aperture.

4 more elements

A charged-particle-beam (CPB) optical system, comprising:

an illumination-optical system situated along an optical axis and including an illumination lens, a deflector, and an aperture-angle-limiting aperture, the illumination-optical system being transmissive to an illumination beam propagating from a beam source;
a projection-optical system, situated along the optical axis downstream of the illumination-optical system, the projection-optical system including a projection lens and being transmissive to an imaging beam propagating along a propagation axis from the illumination-optical system;
and
a beam-alignment device configured to determine a condition of alignment of the propagation axis of the imaging beam with a center of the aperture-angle-limiting aperture, the beam-alignment device comprising
(a) an alignment-measurement aperture situated at an imaging plane;
(b) a beam detector situated downstream of the alignment-measurement aperture;
(c) a scanning deflector situated upstream of the alignment-measurement aperture, the scanning deflector being configured to deflect the imaging beam in two dimensions, perpendicular to the optical axis, over the alignment-measurement aperture;
and
(d) a controller connected to the beam detector and the scanning deflector, the controller being configured to
(i) energize the scanning deflector so as to deflect the imaging beam in the two dimensions over the alignment-measurement aperture,
(ii) obtain a signal from the beam detector corresponding to a two-dimensional image of intensity of the imaging beam passing through the alignment-measurement aperture,
(iii) identify a point of maximum intensity corresponding to the propagation axis, and
(iv) based on the two-dimensional image, energize the deflector in the illumination-optical system as required to align the propagation axis with the center of the aperture-angle-limiting aperture.

10 more elements

Dependencies are inferred from the claim text.

Facts

Application: 09/765,530Filed 19 Jan 2001
Published: US 2001/0010362 A12 Aug 2001
Granted: 19 Aug 2003
Term ends: Not estimatedThe source records don’t support an estimate.

Classification10 codes

G21K 1/08
Arrangements for handling particles or ionising radiation, e.g. focusing or moderating: deviation, concentration or focusing of the beam by…
B82Y 10/00
Nanotechnology for information processing, storage or transmission
B82Y 40/00
Manufacture or treatment of nanostructures
H01J 37/304
Electron-beam or ion-beam tubes for localised treatment of objects: controlling tubes by information coming from the objects or from the beam,…