Automatic background ejection (ABE)
AssigneeSiemens Energy & Automation, Inc.
InventorsDuane P. Littlejohn, Thomas Knudsen
Life of this patent
Estimating the term…
Abstract
A mass spectrometer (MS) which uses the Fourier transform ion cyclotron resonance (FTICR) technique to determine the mass of ions. The MS is prepared with a surface that guarantees that a particle striking the surface will have at least one contact with the cathode and will most likely be re-pumped before escaping into the vacuum chamber volume.
Claims2
An ion pump in combination with an ionization chamber comprising of charged particles, which arc initiated by field ionization in a vacuum chamber volume, that bombard samples immersed in a magnetic field, said samples break apart due to the bombardment yielding an oppositely charged fragment, which is driven to a detection cathode, said ion pump comprising a surface of said detection cathode which automatically select excite frequencies of said fragmented ions to eject unwanted ions during said field ionization.
Dependencies are inferred from the claim text.