Abnormal pattern detection processing method and system
AssigneeFuji Photo Film Co., Ltd.
InventorHideya Takeo
Life of this patent
Estimating the term…
Loading patent…
AssigneeFuji Photo Film Co., Ltd.
InventorHideya Takeo
Estimating the term…
Image signals, which represent images of an object to be subjected to abnormal pattern detection processing, are selected from given image signals. When a selected image signal, which represents an image of the object to be subjected to the abnormal pattern detection processing, is received, an input monitoring device monitors feeding of all of the other image signals, which are to be grouped together with the received image signal and which represent images of the same object of the same patient. In cases where all of the other image signals have been received, the input monitoring device feeds all of the received image signals, which represent the images of the same object of the same patient and which are to be subjected to the abnormal pattern detection processing, in a single set into the abnormal pattern detection processing step. The abnormal pattern detection processing is performed on the image signals having been fed in the single set.
An abnormal pattern detection processing method, comprising the steps of:
An abnormal pattern detection processing system, comprising:
Dependencies are inferred from the claim text.