Surface inspecting apparatus and method therefor
AssigneeElectronics and Telecommunications Research Institute
InventorsChang Joon Park, Hyeon Jin Kim, Weon Geun Oh
Life of this patent
Estimating the term…
Loading patent…
AssigneeElectronics and Telecommunications Research Institute
InventorsChang Joon Park, Hyeon Jin Kim, Weon Geun Oh
Estimating the term…
A surface inspecting apparatus comprises an image achieving unit for achieving an image of a surface of an object; and a controller for providing the symmetry feature of the spot or contaminant by using the magnitude of the intensity gradient and the orientation of the intensity gradient for each pixel of the achieved surface image to thereby detect a spot or contaminant on the surface. The controller detects the spot or contaminant by using a symmetry magnitude map formed by the magnitude of the intensity gradient and the orientation of the intensity gradient of each pixel, after achieving the magnitude of the intensity gradient and the orientation of the intensity gradient by using a gradient operator on the achieved surface image, wherein the symmetry magnitude map provides the internal symmetry feature of the spot or contaminant.
An apparatus for inspecting a surface of an object, comprising:
A method for inspecting a surface of an object, for use in a surface inspecting apparatus, comprising the steps of:
A computer-readable recording medium for storing a program implementing a method for inspecting a surface of an object in an apparatus having a large capability processor the method comprising the steps of:
Dependencies are inferred from the claim text.