Light beam scanning device
AssigneeFuji Photo Film Co., Ltd.
InventorAkinori Harada
Life of this patent
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Abstract
Light sources of a light beam scanning device of the present invention are an AlGaInP semiconductor laser emitting a light beam of a wavelength of 680 nm, a GaN extremely small surface area light emitting diode (EELED) emitting a light beam of a wavelength of 530 nm, and a GaN EELED emitting a light beam of a wavelength of 470 nm. Such a structure provides a light beam scanning device which is compact, whose manufacturing cost is low, and with which light beams having light emission distributions corresponding to spectral sensitivities of a photosensitive material.
Claims15
A light beam scanning device comprising:
- a plurality of light emitting elements which emit light beams of respectively different wavelengths selected in accordance with spectral sensitivities of a photosensitive material, at least one of the plurality of light emitting elements being an extremely small surface area light emitting diode whose surface area of light emitting region is from 0.1 μm2 to 64 μm2;
- and
- scanning means for scanning the photosensitive material by the light beams emitted from the plurality of light emitting elements.
A method of scanning a plurality of light beams over a photosensitive material, comprising:
- modulating a plurality of light emitting elements that respectively emit the plurality of light beams, wherein at least one of said plurality of light emitting elements is an extremely small surface area light emitting diode having a surface area of a light emitting region from 0.1 μm2 to 64 μm2;
- directing said emitted light beams through a plurality of collimating lenses, beam correction optical systems, and cylindrical lenses;
- reflecting said emitted light beams off a mirror array;
- and
- directing said emitted light beams from the mirror array and scanning said emitted light beams across the photosensitive material.
Dependencies are inferred from the claim text.