Sample inspecting apparatus
AssigneeNidek Co., Ltd.
InventorTatefumi Oda
Life of this patent
Estimating the term…
Abstract
A sample inspecting apparatus which performs a visual inspection of a sample to be inspected by reflected light therefrom, the apparatus comprising holding device which holds the sample at its periphery, first rotating device which rotates the holding device on a first axis passing through an approximate center of the sample being held by the holding device and second rotating device which rotates the holding device on a second axis passing through the approximate center of the sample being held by the holding device.
Claims7
A wafer inspecting apparatus for performing a visual inspection of a wafer in light reflected therefrom, the apparatus comprising:
- a wafer holder including a ring-shaped first holder for holding a wafer to be inspected at its periphery with at least three chuck units that contact an edge and a back surface of the wafer and a second holder rotatably holding the first holder;
- a first rotatable shaft fixed to the wafer holder and rotatable on a first axis, the first axis passing through an approximate center of the wafer being held by the wafer holder and being approximately parallel to a plane of the held wafer;
- a shaft holder for rotatably holding the first shaft and movable between a wafer delivery position and a wafer inspection position;
- and
- a second rotatable shaft fixed to the shaft holder and rotatable on a second axis, the second axis passing through the approximate center of the wafer being held by the wafer holder and being approximately parallel to the plane of the held wafer.
Dependencies are inferred from the claim text.