Zero connection for on-chip testing
AssigneeIntel Corporation
InventorsDon G. Craven, Joe A. Harrison
Life of this patent
Estimating the term…
Abstract
In order to make a connection to a test bus on a printed circuit board within a system or platform for the purpose of testing circuits within the system, a regular pattern of contact points which are coupled to the circuits to be tested are formed on the printed circuit board. The contact points are contacted with a plurality of spring loaded contacts, supported in a pattern which is the same as the pattern of contact points, with the spring loaded contacts being coupled to test equipment for testing the circuits.
Claims14
A method of coupling to circuits in a system including a printed circuit board for the purpose of testing the circuits comprising:
- a. forming, on the printed circuit board, a regular pattern of contact points which are coupled to circuits to be tested;
- b. contacting said contact points with a plurality of spring loaded contacts coupled to test equipment for testing said circuits, supported in a pattern which is the same as said pattern of contact points;
- c. forming alignment guides on said printed circuit board adjacent said pattern and aligning said plurality of spring loaded contacts using said alignment guides;
- d. coupling inputs of said test probe to an transition printed circuit board having a pattern of contact points the same as the pattern on said printed circuit board;
- e. supporting said spring loaded contacts in a block;
- f. supporting said block, said test probe and said transition printed circuit board in a housing;
- g. coupling said spring loaded contacts to said contact points on said transition printed circuit board;
- and
- h. engaging the alignment guides on the printed circuit board with alignment guides coupled to said housing.
Apparatus for coupling to circuits in a system which includes a printed circuit board for the purpose of testing the circuits using a regular pattern of contact points on the printed circuit board, which contact points are coupled to the circuits to be tested, comprising;
- a. a test probe assembly including a test probe having on the end thereof a plurality of spring loaded contacts coupled to said test probe, said contacts supported in a pattern which is the same as said pattern of contact points;
- b. alignment guides formed on said printed circuit board adjacent said pattern and mating alignment guides on said test probe assembly;
- c. an transition printed circuit board having a pattern of contact points the same as the pattern on a printed circuit board to be contacted by said test probe assembly coupled to inputs of said probe;
- d. a block supporting said spring loaded contacts, said spring loaded contacts coupled to said contact points on said transition printed circuit board;
- and
- e. a housing supporting said block, said test probe and said transition printed circuit board, said mating alignment guides also coupled to said housing.
A system for testing circuits in a system including a printed circuit board comprising:
- a. a regular pattern of contact points on the printed circuit board, which contact points are coupled to the circuits to be tested;
- b. a test probe assembly including a test probe and having on the end thereof a plurality of spring loaded contacts coupled to said test probe, said contacts supported in a pattern which is the same as said pattern of contact points;
- and
- c. a cable to couple said test probe to host test equipment;
- d. alignment guides formed on said printed circuit board adjacent said pattern and mating alignment guides on said test probe assembly;
- e. an transition printed circuit board having a pattern of contact points the same as the pattern on said printed circuit board to be contacted by said test probe assembly coupled to inputs of said probe;
- f. a block supporting paid spring loaded contacts, said spring loaded contacts coupled to said contact points on said transition printed circuit board;
- and
- g. a housing supporting said block, said test probe and said transition printed circuit board, said mating alignment guides also coupled to said housing.
Dependencies are inferred from the claim text.