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US 6,605,950 B2Granted
Method and apparatus for measuring film thicknesses
AssigneePlast-Control Gerätebau GmbH
InventorMarkus Stein
Life of this patent
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Abstract
A method for measuring the film thickness with the help of a measuring head (12), which is held with a holding device (14) against the film (10), so that the latter is deflected, wherein the reaction force (F), exerted by the film (10) on the measuring head (12), is measured and controlled to a specified nominal value by the movement of the measuring head.
Claims18
A method for measuring film thicknesses with the help of a measuring head, which is held with a holding device against a film, comprising the steps of:
- deflecting the film by a measuring head,
- measuring a reaction force, exerted by the film on the measuring head, and
- controlling the reaction force to a specified nominal value by movement of the measuring head, in response to the step of measuring.
An apparatus for measuring film thicknesses, comprising:
- a measuring head,
- a holding device which holds the measuring head,
- a driving mechanism for moving the holding device relative to a film so as to deflect the film for measurement, and
- a measuring device for measuring the extent to which the film is deflected by the measuring head, the measuring device including a force sensor which measures a reaction force of the film, which is transferred by the measuring head to the holding device, as a measure of deflection of the film by the measuring device.
1 more element
Dependencies are inferred from the claim text.