Cartridge system for a probing head for an electrical test probe
AssigneeLeCroy Corporation
InventorsJulie A. Campbell, Stephen Mark Sekel, Stanley Joseph Sula
Life of this patent
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Abstract
A cartridge system includes a main probing head body with electronics positioned therein. Further, the cartridge system includes a probing tip cartridge having a probing tip. An electrical contact mechanism electrically couples the electronics to the probing tip when the probing tip cartridge is in mating relationship with the main probing head body. The types may be, for example, a pointed tip, a socket tip, or a grabber tip.
Claims18
A cartridge system for an electrical test probe, said system comprising:
- (a) a main probing head body said main probing head body having an external peripheral surface;
- (b) electronics positioned within said main probing head body;
- (c) an electrical contact mechanism directly electrically coupled to said electronics, said electrical contact mechanism protruding from said external peripheral surface;
- (d) a probing tip cartridge interconnectable with said main probing head body;
- (e) a probing tip with a conductive surface, at least part of said conductive surface being exposed;
- (f) said probing tip interconnectable with said probing tip cartridge;
- (g) said probing tip cartridge being a switchable and replaceable probing tip cartridge;
- (h) said electrical contact mechanism contacting said conductive surface when said probing tip cartridge is in mating relationship with said main probing head body;
- and
- (i) a signal testing instrument functionally associatable with said probing tip so that a signal through said probing tip may be measured by said signal testing instrument.
A method for using a cartridge system for an electrical test probe, said method comprising the steps of:
- (a) providing a main probing head body having electronics positioned therein and an electrical contact mechanism directly electrically coupled to said electronics, said main probing head body having an external peripheral surface;
- (b) providing a switchable and replaceable probing tip cartridge;
- (c) providing a probing tip with a conductive surface defined therein, at least part of said conductive surface being exposed, said probing tip interconnectable with said probing tip cartridge;
- (d) protruding said electrical contact mechanism from said external peripheral surface of said main probing head body;
- (e) bringing said probing tip cartridge into mating relationship with said main probing head body;
- (f) coupling electronically said electrical contact mechanism with said conductive surface;
- (g) securing said probing tip cartridge in mating relationship with said main probing head body;
- (h) providing a signal testing instrument;
- (i) associating functionally said probing tip with said signal testing instrument;
- and
- (j) testing a signal through said probing tip using said signal testing instrument.
A cartridge system for an electrical test probe, said system comprising:
- (a) a main probing head body, said main probing head body having an external peripheral surface;
- (b) electronics positioned within said main probing head body;
- (c) a switchable and replaceable probing tip cartridge;
- (d) a probing tip interconnectable with said probing tip cartridge;
- and
- (e) an electrical contact mechanism for electrically coupling said electronics to said probing tip when said probing tip cartridge is in mating relationship with said main probing head body, said electrical contact mechanism protruding from said external peripheral surface.
Dependencies are inferred from the claim text.