Method for improving nucleation and adhesion of CVD and ALD films deposited onto low-dielectric-constant dielectrics
AssigneeIntel Corporation
InventorsJihperng Leu, Chih-I Wu, Ying Zhou, Grant M. Kloster
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AssigneeIntel Corporation
InventorsJihperng Leu, Chih-I Wu, Ying Zhou, Grant M. Kloster
Estimating the term…
A method to improve nucleation and/or adhesion of a CVD or ALD-deposited film/layer onto a low-dielectric constant (low-k) dielectric layer, such as a polymeric dielectric or a carbon-doped oxide. In an embodiment, the method includes providing a substrate into a deposition chamber. A dielectric layer having a reactive component is formed over the substrate. The formed dielectric layer having the reactive component is then processed to produce polar groups or polar sites at least on a surface of the formed dielectric layer. The present invention forms a low-k organic polymer dielectric layer or an organic-doped oxide dielectric layer having improved nucleation and/or adhesion properties for a subsequently deposited layer such as a barrier material layer.
A method comprising:
The method of claim, 1 wherein forming the dielectric layer includes adding a precursor solution to introduce the reactive component when forming the dielectric layer using chemical vapor deposition or atomic layer deposition.
A method comprising:
Dependencies are inferred from the claim text.