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US 6,605,505 B2Granted
Process for producing an integrated semiconductor memory configuration
AssigneeSiemens Aktiengesellschaft
InventorsFrank Hintermaier, Carlos Mazure-Espejo
Life of this patent
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Abstract
A process for producing an integrated semiconductor memory configuration, in particular one suited to the use of ferroelectric materials as storage dielectrics, in which a conductive connection between one electrode of a storage capacitor and a selection transistor is not produced until after the storage dielectric has been deposited; and a semiconductor memory configuration produced using the production process.
Claims8
A process for producing an integrated semiconductor memory configuration, which comprises:
- providing a configuration of selection transistors having source regions and an insulation layer formed with contact holes extending through to the source regions;
- subsequently providing first contact plugs in the contact holes;
- subsequently applying at least one first electrode on a surface of the insulation layer;
- and forming the first electrode with cutouts exposing surfaces of the first contact plugs and regions of the surface of the insulation layer adjacent the contact holes;
- subsequently depositing a dielectric layer on the surfaces of the first contact plugs, the regions of the surface of the insulation layer adjacent the contact holes, and the first electrode;
- subsequently depositing a second layer of electrode material on the dielectric layer;
- subsequently separating the second layer of electrode material into sections to produce second electrodes;
- subsequently exposing the surfaces of the first contact plugs by etching the dielectric layer and the second electrodes and removing oxidized regions of the contact plugs;
- and
- subsequently producing second contact plugs above the exposed first contact plugs electrically connecting a respective one of the second electrodes to a respective one of the first contact plugs.
7 more elements
Dependencies are inferred from the claim text.