Semiconductor device testing apparatus and method for testing semiconductor device

A semiconductor device testing apparatus for testing a plurality of semiconductor devices;

• comprising:
• a test pattern generating unit for outputting an input signal pattern to said semiconductor devices and outputting an expectation value signal pattern, which is expected to be output from said semiconductor device when said input signal pattern is applied to said semiconductor device;
• a comparator that compares an output signal patterns, which are output from said plurality of semiconductor devices, and a predetermined value determined based on said expectation value signal pattern and outputs a match signal when said output signal patterns match said predetermined value;
• a match-fail detecting unit for receiving said match signal to detect a semiconductor device, said output signal pattern of which does not match said predetermined value, and outputting a match-fail signal for identifying said semiconductor device, said output signal pattern of which does not match said predetermined value;
• and
• a stop signal output unit connected to said match-fail detecting unit for receiving said match-fail signal from said match-fail detecting unit, storing said match-fail signal, and outputting a first stop signal that stops application of said input signal pattern to said semiconductor devices, said output signal patterns of which does not match said predetermined value, identified by said stored match-fail signal.

A method for testing a plurality of semiconductor devices;

• comprising:
• outputting an input signal pattern to said semiconductor devices;
• outputting an expectation value signal pattern, which is expected to be output from said semiconductor device when said input signal pattern is applied to said semiconductor device;
• comparing an output signal patterns, which are output from said plurality of semiconductor devices, and a predetermined value determined based on said expectation value signal pattern;
• outputting said match signal when said output signal patterns matches said predetermined value;
• outputting a match-fail signal when said output signal pattern output from said semiconductor device does not match said predetermined value;
• storing said match-fail signal;
• and
• outputting a first stop signal for stopping an application of said input signal pattern to said semiconductor devices identified by said stored match-fail signal.

A method for testing a semiconductor device for testing a plurality of semiconductor devices, comprising:

• applying an input signal pattern to each of said plurality of semiconductor devices;
• stopping an application of said input signal pattern to said semiconductor devices that output an active match signal, said match signal becomes active when an output signal pattern output from said semiconductor device matches a predetermined value;
• and
• restarting said application of said input signal pattern only to said semiconductor devices that output said active match signal.