Scanning capacitance sample preparation technique

A method for determining a property of a material with respect to at least two dimensions, comprising the steps of:

• providing one or more areas on a crystalline substrate having a principal surface with an etch mask material provided on said principal surface;
• selecting one or more said areas for analysis;
• lithographically patterning one or more openings in said etch mask material across the selected areas;
• anisotropically etching into said selected areas wherein the anisotropic etch stops on a crystalline plane of said crystalline substrate, such that a substantially atomically smooth cross-sectional surface results;
• measuring a material property from said atomically smooth cross-sectional surface to thereby obtain a true representation of said material property by moving a fine tip in close proximity to said cross-sectional surface of said crystalline substrate within a predetermined scan area;
• relating said measured data according to a predetermined relationship to derive said material property at each of the locations, whereby data for said material property is provided with respect to at least two dimensions in the region of said scan.

A process for preparing a sample for precise measurement of electrical properties comprising:

• providing one or more areas on a crystalline substrate having a principal surface with an etch mask material provided on said principal surface;
• selecting one or more of said areas for analysis;
• lithographically patterning one or more openings in said etch mask material across the selected areas;
• anisotropically etching into said selected areas wherein the anisotropic etch stops on a crystalline plane of said crystalline substrate, forming a substantially atomically smooth cross-sectional surface in each said selected area;
• lithographically patterning and etching one or more regions near said selected areas and forming an electrical contact in said regions such that a nearby electrical ground is provided to improve electrical measurement;
• applying electrical measurement to said atomically smooth cross-sectional surface to thereby obtain a true representation of a spatial distribution of electrical properties in one or more dimensions.

A process for preparing a sample for precise measurement of electrical properties comprising:

• providing one or more areas on a crystalline substrate having a principal surface with an etch mask material provided on said principal surface;
• selecting one or more of said areas for analysis and selecting a region nearby each selected area;
• lithographically patterning a plurality of openings in said etch mask material across said selected areas and across said nearby regions;
• anisotropically etching into selected areas and said nearby regions wherein the anisotropic etch stops on crystalline planes of said crystalline substrate, forming substantially atomically smooth cross-sectional surfaces which cross-section said selected areas and said nearby regions;
• forming one or more electrical contacts in each said nearby region such that a nearby electrical ground is provided to reduce electrical resistance of said ground and thereby improve electrical measurement;
• applying electrical measurement to said atomically smooth cross-sectional surfaces to thereby obtain a true representation of a spatial distribution of electrical properties in one or more dimensions.

A process for preparing a sample for precise measurement of electrical properties comprising:

• providing one or more areas on a crystalline substrate having a principal surface and a secondary surface with an etch mask material provided on one or more surfaces of said crystalline substrate;
• selecting one or more of said areas for analysis;
• lithographically patterning one or more openings in said etch mask material across the selected areas;
• anisotropically etching into said selected areas wherein the anisotropic etch stops on crystalline planes of said crystalline substrate, forming substantially atomically smooth cross-sectional surfaces which cross-section said selected areas;
• thinning or etching of said substrate or a region of said substrate near said selected areas and forming an electrical contact thereon such that a nearby electrical ground is provided to improve electrical measurement;
• Applying electrical measurement to said atomically smooth cross-sectional surface to thereby obtain a true representation of a spatial distribution of electrical properties in one or more dimensions.

A method for deconvolving sensed Scanning Capacitance Microscopy (SCM) data into electrical charge concentration data wherein the deconvolution method comprises a database populated with theoretical capacitance versus voltage responses for local structure parameters, said database comprising:

• an SCM sensing tip placed at an angle relative to a surface normal;
• a non-zero spatial concentration gradient in electrical charge distribution in one or more dimensions;
• an average concentration of electrical charge;
• a non-zero radius of the sensing tip point;
• a capacitance due to said dielectric material;
• a direct-current (DC) bias voltage applied to said sensing tip;
• such that
• said deconvolution comprises iteratively searching said database to derive actual structure parameters from said sensed SCM values.

A process for preparing a sample for precise measurement of electrical properties comprising:

• providing one or more areas on a crystalline substrate having a principal surface with an etch mask material provided on said principal surface;
• selecting one or more said areas for analysis;
• lithographically patterning one or more openings in said etch mask material across the selected areas;
• anisotropically etching into said selected areas wherein the anisotropic etch stops on a crystalline plane of said crystalline substrate, such that a substantially atomically smooth cross-sectional surface results;
• applying electrical measurement to said atomically smooth cross-sectional surface to thereby obtain a true representation of a spatial distribution of electrical properties in one or more dimensions, wherein said electrical measurement includes Scanning Capacitance Microscopy to measure active dopant concentrations in the range from 1×1015 to 5×1021 per cubic cm., and wherein said anisotropic etch is followed by a chemical or electrochemical polish such that surface properties of said cross-sectional surface are improved.

A process for preparing a sample for precise measurement of electrical properties comprising:

• providing one or more areas on a crystalline substrate having a principal surface with an etch mask material provided on said principal surface;
• selecting one or more said areas for analysis;
• lithographically patterning one or more openings in said etch mask material across the selected areas;
• anisotropically etching into said selected areas wherein the anisotropic etch stops on a crystalline plane of said crystalline substrates such that a substantially atomically smooth cross-sectional surface results;
• applying electrical measurement to said atomically smooth cross-sectional surface to thereby obtain a true representation of a spatial distribution of electrical properties in one or more dimensions, and wherein a dielectric material is placed into contact with said cross-sectional surface to facilitate or improve said electrical measurement, such that placement of said dielectric material is followed by a thermal treatment in an ambient designed to improve electrical properties at interface between said cross-sectional surface and said dielectric film, such as a forming gas anneal.