Apparatus and method for measuring vision defects of a human eye

A method for measuring vision characteristics of an eye, the method comprising the steps of:

• projecting an optical beam through a sufficiently small angle about an optical path for passing the beam through the pupil of the eye and providing a finite spot on the retina of the eye;
• focusing the optical beam proximate behind a retina of the eye for placing a finite source of secondary radiation on the retina, which secondary radiation provides light emitted from the retina and through the pupil as a reflected wavefront of radiation;
• and
• directing the reflected wavefront onto a wavefront analyzer for measuring distortions associated with the reflected wavefront.

A method for measuring optical characteristics of an optical system, the method comprising the steps of:

• focusing an optical beam proximate a posterior surface of the optical system for placing a finite source of secondary radiation on a focal surface of the optical system, wherein the posterior surface is other than the focal surface, which secondary radiation is emitted from the focal surface as a reflected wavefront of radiation that passes through the optical system;
• projecting the reflected wavefront onto a wavefront analyzer;
• and
• measuring characteristics of the optical system associated with the reflected wavefront.

A method for measuring vision defects of an eye comprising the steps of:

• focusing an optical beam anterior of the retina of the eye, but not on the retina, for placing a finite source of secondary radiation on the retina, which secondary radiation is emitted from the retina as a reflected wavefront of radiation that passes through the eye;
• projecting the reflected wavefront onto a wavefront analyzer;
• and
• measuring distortions associated with the reflected wavefront.