Partially crosslinked polymer for bilayer photoresist
AssigneeHyundai Electronics Industries Co., Ltd.
InventorsGeun Su Lee, Jae Chang Jung, Min Ho Jung, Ki Ho Baik
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AssigneeHyundai Electronics Industries Co., Ltd.
InventorsGeun Su Lee, Jae Chang Jung, Min Ho Jung, Ki Ho Baik
Estimating the term…
The present invention provides photoresist monomers, photoresist polymers derived from the same, processes for producing such photoresist polymers, photoresist compositions comprising such polymers, and processes for producing a photoresist pattern using such photoresist compositions. In particular, photoresist monomers of the present invention comprise a moiety of Formula 4: where R1, R2, R3 and R4 are those defined herein. Photoresist polymers of the present invention have a relatively high etching resistance, and therefore are useful in a thin resist process and a bilayer photoresist process. Moreover, photoresist polymers of the present invention have a high contrast ratio between an exposed region and a non-exposed region.
A photoresist polymer derived from a monomer comprising a first monomer selected from the group consisting of compounds of the formula:
A photoresist composition comprising:
Dependencies are inferred from the claim text.