System and method for single point observability of a dual-mode control interface
AssigneeHewlett-Packard Development Company, L.P.
InventorsIan P. Shaeffer, Jeffrey C. Swanson
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Abstract
The present invention provides for a method and system for external observation of a dual mode control interface, via a single point of entry/exit from a chip. In operation, data is sent into and retrieved from a chip using a single point on the chip. Multiple test methods can be used with the proper test method selected by an established hierarchy of methods. In one embodiment, an impedance is shown for control purposes between test methods.
Claims19
A method of utilizing a single point to monitor debugging data of a subject chip in order to prepare a diagnostic test, said method comprising the steps of:
- establishing a hierarchy which dictates prevailing control methods;
- and
- employing said prevailing control method to obtain debugging data from said subject chip via said single point in order to prepare a diagnostic test.
A module for utilizing a single point to monitor debugging data of a subject chip, said module comprising:
- a hierarchy module for establishing a hierarchy which dictates one prevailing control apparatus;
- a control module for employing said prevailing control apparatus to obtain debugging data from a said subject chip in order to prepared a diagnostic test;
- and
- a reception module for receiving said debugging data from said subject chip via said single point.
A method of providing a chip according to diagnostic testing which utilizes a single pin to monitor debugging data of a subject chip, said method comprising the steps of:
- establishing a hierarchy which dictates a prevailing control method;
- and
- employing said prevailing control method to obtain debugging data from a said subject chip via said single point in order to prepared a diagnostic test.
A test system for debugging data of a subject chip, said system comprising:
- means for establishing a hierarchy in which one of a plurality of test methods will be used at a given point in time;
- and
- means for employing a prevailing one of said test method to obtain debugging data from said subject chip via a single point on said chip in order to prepared a diagnostic test.
Dependencies are inferred from the claim text.