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AssigneeAgilent Technologies, Inc.
InventorsLee Alton Barford, Christian Zurhorst
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Disclosed is a method for determining a system model describing a relation between applicable tests and components of a system under test (SUT). The system model is applicable in conjunction with actual test results for determining at least one fault candidate representing a specific component of the SUT likely to have caused a fault of the SUT. The method system model of the SUT is determined by determining configuration information describing the actual set of components—or parts thereof—in the SUT, and combining the configuration information with static information, for dragging from the static information the information relating to the SUT. The static information describes general information about the SUT, and/or possible components of the SUT, and/or tests applicable for the SUT, and/or relations therebetween.
A method for determining a system model describing a relation between applicable tests and components of a system under test (SUT), whereby the system model is applicable in conjunction with actual test results for determining at least one fault candidate representing a specific component of the SUT likely to have caused a fault of the SUT, preferably provided with a certain probability that the component has caused the failure;
A system for determining a system model describing a relation between applicable tests and components of a system under test (SUT), whereby the system model is applicable in conjunction with actual test results for determining at least one fault candidate representing a specific component of the SUT likely to have caused a fault of the SUT, preferably provided with a certain probability that the component has caused the failure, the system comprising:
Dependencies are inferred from the claim text.