Windowing scheme for analyzing noise from multiple sources
AssigneeSun Microsystems, Inc.
InventorsKathirgamar Aingaran, Manjunath D. Haritsa, Lakshminarasimhan Varadadesikan
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AssigneeSun Microsystems, Inc.
InventorsKathirgamar Aingaran, Manjunath D. Haritsa, Lakshminarasimhan Varadadesikan
Estimating the term…
Method and apparatus for detecting and analyzing effects of noise in a digital circuit that arises from a coupling of signals produced by switching of a first gate and a second gate in a timed relationship. Where each of a first gate and a second gate can switch within a selected switching time interval, the gate switching effects are combined and the second gate output signal is analyzed with reference to the first gate input signal. Otherwise, the gate switching effects are not combined. When the second gate output signal satisfies at least one of three criteria, this condition is interpreted as indicating that the second gate permits propagation of a noise pulse produced at the first gate.
A method for detecting and analyzing effects of noise in a digital circuit, the method comprising:
A method for detecting and analyzing effects of noise in a digital circuit, the method comprising:
A system for detecting and analyzing effects of noise in a digital circuit, the system comprising a computer that is programmed:
A system for detecting and analyzing effects of noise in a digital circuit, the system comprising a computer that is programmed:
An article of manufacture comprising:
Dependencies are inferred from the claim text.