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US 6,587,801 B2Granted
Abnormality-cause identifying apparatus and method
AssigneeMitsubishi Denki Kabushiki Kaisha
InventorHaruo Funakoshi
Life of this patent
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Abstract
Disclosed is an abnormality-cause identifying apparatus including: a retrieving unit for retrieving quality data conforming to retrieving conditions; and a computing unit for computing mean values and standard deviations of the retrieved quality data, the computing unit further computing the likelihood of abnormality of each of manufacturing apparatuses, on the basis of the mean values and the standard deviations.
Claims4
An abnormality-cause identifying apparatus comprising:
- setting means for setting conditions for retrieving quality data;
- retrieving means for retrieving quality data conforming to the retrieving conditions set by said setting means;
- and
- computing means for computing, in a population including a plurality of manufacturing candidates that could have caused an abnormality, mean values and standard deviations of the conforming quality data retrieved by said retrieving means, and for computing a likelihood of abnormality of each of the manufacturing candidates, on the basis of the mean values and standard deviations.
1 more element
Dependencies are inferred from the claim text.