RF test set with concurrent measurement architecture
AssigneeAgilent Technologies, Inc.
InventorsKerwin D. Kanago, David L. Platt, James B. Summers, Melvin D. Humpherys, Richard P. Ryan, Matthew Johnson
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AssigneeAgilent Technologies, Inc.
InventorsKerwin D. Kanago, David L. Platt, James B. Summers, Melvin D. Humpherys, Richard P. Ryan, Matthew Johnson
Estimating the term…
An RF test set having a concurrent measurement architecture is provided. The RF test set is adapted for testing an RF communications device such as a cellular phone according to a set of RF tests. An RF source and an RF receiver are used to communicate with the cellular phone in order to perform the call processing operations to control the cellular phone while performing parametric measurements according to the RF tests. Concurrent measurements allow operation of concurrent measurement processes and call processing operations to take place in the RF test set in order to decrease the time required for each RF test and to increase measurement throughput of the RF test set.
A method of testing a radio-frequency (RF) communications device, said method comprising the steps of:
A system for testing a radio-frequency (RF) communications device, said system comprising:
A method of testing a radio-frequency (RF) communications device, said method comprising the steps of:
A system for testing a radio-frequency (RF) communications device, said system comprising:
Dependencies are inferred from the claim text.