Method and apparatus for reducing write operation time in dynamic random access memories
AssigneeInternational Business Machines Corporation
InventorsToshiaki Kirihata, Sang Hoo Dhong, Hwa-Joon Oh
Life of this patent
Estimating the term…
Loading patent…
AssigneeInternational Business Machines Corporation
InventorsToshiaki Kirihata, Sang Hoo Dhong, Hwa-Joon Oh
Estimating the term…
A method for preparing a dynamic random access memory (DRAM) cell for a write operation with a preset condition is disclosed. In an exemplary embodiment, the method includes creating a preset voltage level within the cell prior to a delayed write back in a destructive read architecture, which preset voltage level has a value between a logic 0 voltage level and a logic 1 voltage level. The logic 0 voltage level corresponds to a first cell voltage value when the cell has a 0 bit stored therein, and the logic 1 voltage level corresponds to a second cell voltage value when the cell has a 1 bit stored therein. Prior to the creation of the preset voltage level within the cell, the cell has an initial voltage value corresponding to either the logic 0 voltage level or the logic 1 voltage level.
A method for preparing a dynamic random access memory (DRAM) cell for a write operation, the method comprising:
A method for reducing the write time for a dynamic random access memory (DRAM) cell, the cell including a data bit storage element for storing a data bit at a logic 0 voltage level or at a logic 1 voltage level, the method comprising:
A computer memory element, comprising:
A computer memory system, comprising:
Dependencies are inferred from the claim text.