Semiconductor device

A semiconductor device, comprising:

• a semiconductor chip comprising a delay unit having a delay time, and a delay time measuring unit for measuring the delay time, wherein
• said delay time measuring unit generates a measurement result signal, which is a digital signal, based on the delay time, and outputs the measurement result signal outside the semiconductor chip, wherein said delay time measuring unit comprises:
• a trigger pulse generation circuit for inputting an input trigger pulse into said delay unit for delaying the input trigger pulse by the delay time and outputting an output trigger pulse;
• a counter group circuit for receiving n clock signals having different phases, holding n counter values, and changing an i-th counter value in the n counter values in response to an i-th clock signal (i indicates any natural number equal to or smaller than n) in the n clock signals since the input trigger pulse is input into said delay unit until the output trigger pulse is output from said delay unit;
• and
• a measurement result signal generation unit for generating the measurement result signal based on the counter value.