Measuring device for testing unpacked chips
AssigneeInfineon Technologies AG
InventorsBernd Klehn, Bernhard Knuepfer
Life of this patent
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AssigneeInfineon Technologies AG
InventorsBernd Klehn, Bernhard Knuepfer
Estimating the term…
A measuring device has a needle-board circuit board carrying a large number of contact-making needles for contacting connecting areas on an IC circuit. The measuring device has lines for feeding test signals at a high clock frequency to the contact-making needles, and for carrying measured signals away from the contact-making needles. The needles have a shank part with a length L2 and a tip part 14 adjacent thereto with a length L1. For optimally transmitting signals in terms of impedance, the lines are formed as dual-transmission conductor tracks, the shank parts of the contact-making needles each contact a section of the conductor tracks, and the overall length of the contact-making needles satisfies: L1+L2<λ/2, where λ is the maximum wavelength of the signal that is transmitted via a respective line.
A measuring device for testing unpacked chips, comprising:
Dependencies are inferred from the claim text.