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US 6,586,959 B1Granted
Method and apparatus for testing circuitry
AssigneeSTMicroelectronics S.r.l.
InventorStephen Firth
Life of this patent
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Abstract
A method of testing a circuit which includes the steps of applying at least one input reference signal to a circuit under test which provides a reference signal from at least one output of the circuit under test, and defining at least one output signal of the circuit with reference to the reference output signal, wherein the timing of the output reference signal is defined independently of the input reference signal.
Claims17
A method of testing a circuit comprising the steps of:
- applying at least one input reference signal to a circuit under test;
- providing a reference signal from at least one output of said circuit under test;
- and
- defining at least one output signal of said circuit with reference to said reference output signal, wherein the timing of said output reference signal is defined independently of said input reference signal.
1 more element
Dependencies are inferred from the claim text.