Material thickness measurement using magnetic information
AssigneeQuantum Magnetics, Inc.
InventorsSankaran Kumar, William Frank Avrin, Hoke Smith Trammell, III, Suresh Meempat Menon
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AssigneeQuantum Magnetics, Inc.
InventorsSankaran Kumar, William Frank Avrin, Hoke Smith Trammell, III, Suresh Meempat Menon
Estimating the term…
An apparatus for and a method of measuring material thickness with magnetics. The thickness monitoring system includes a thickness monitor, a probe, and a target. In a preferred embodiment, the probe is positioned on one side of an article for which the thickness is to be determined. The target is positioned on the opposite side of the article from the probe. The probe includes an excitation coil, a field compensation coil, and a magnetic sensor. The method includes energizing the excitation coil to excite a response from the target, compensating for the effect of the excitation coil on the magnetic sensor, measuring the response of the target with the magnetic sensor, and determining the thickness of the article from the measured response. The preferred mode of energizing the excitation coil is with an AC waveform; however DC, multi-frequency AC, or a combination of AC and DC waveforms may be used.
A system for measuring thickness of a material comprising:
A probe for a system for measuring a material thickness comprising a thickness monitor and a target, the probe comprising:
A method of measuring material thickness utilizing a system comprising a thickness monitor, a probe, and a target, the method comprising the steps of:
A system for measuring thickness of a material comprising:
A method of measuring material thickness utilizing a system comprising a thickness monitor and a probe, the method comprising the steps of:
Dependencies are inferred from the claim text.