Method for detecting an element in a sample
AssigneeDeutsches Krebsforschungszentrum Stiftung des Offentlichen Rechts
InventorsAnsgar Haking, Karsten Richter
Life of this patent
Estimating the term…
Abstract
A method for detecting an element in a sample using a transmission electron microscope to measure a first image of the intensities of the sample at an energy loss in the range of the element signal. The background at various points is determined in a comparator sample which does not contain the element intensity. Energy loss is determined at the front of the element signal, and an energy loss is determined in the range of the element signal. From these values an approximation function is calculated so that an image of the pure element-specific intensities can be calculated.
Claims10
a procedure for the detection of an element in a sample comprising the steps of:
- measuring a first image of intensities Ilpof the sample for an energy loss before an element edge using a transmission electronic microscope;
- measuring a second image of intensities I2′p for an energy loss in the area of the element edge;
- determining non-element-specific intensities I1of the sample for an energy loss before the element specific signal edge for various points at a reference sample point that does not contain the element;
- determining non-element-specific intensities I2 for and energy loss in the area of the element specific signal edge;
- calculating an approximation function I2 (I1);
- calculating an image of element-specific intensities IE from these values
- by calculating the corresponding intensity I2p with approximation function for every point in the first image with the intensity I1P and
- by determining the difference between the measured intensity I2′p and and the calculated intensity I2p as the element-specific intensity IE for the corresponding point in the second image.
Dependencies are inferred from the claim text.