Hyperbaric hydrothermal atomic force microscope
AssigneeThe Regents of the University of California
InventorsKevin G. Knauss, Carl O. Boro, Steven R. Higgins, Carrick M. Eggleston
Life of this patent
Estimating the term…
Loading patent…
AssigneeThe Regents of the University of California
InventorsKevin G. Knauss, Carl O. Boro, Steven R. Higgins, Carrick M. Eggleston
Estimating the term…
A hyperbaric hydrothermal atomic force microscope (AFM) is provided to image solid surfaces in fluids, either liquid or gas, at pressures greater than normal atmospheric pressure. The sample can be heated and its surface imaged in aqueous solution at temperatures greater than 100° C. with less than 1 nm vertical resolution. A gas pressurized microscope base chamber houses the stepper motor and piezoelectric scanner. A chemically inert, flexible membrane separates this base chamber from the sample cell environment and constrains a high temperature, pressurized liquid or gas in the sample cell while allowing movement of the scanner. The sample cell is designed for continuous flow of liquid or gas through the sample environment.
An atomic force microscope for imaging a surface of a sample at a selected pressure greater than atmospheric pressure, comprising:
Dependencies are inferred from the claim text.