Plasma ion source mass spectrometer
AssigneeHitachi, Ltd.
InventorsSeiji Kamimura, Isamu Takekoshi, Yasushi Terui, Yasuaki Takada, Takayuki Nabeshima, Minoru Sakairi
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AssigneeHitachi, Ltd.
InventorsSeiji Kamimura, Isamu Takekoshi, Yasushi Terui, Yasuaki Takada, Takayuki Nabeshima, Minoru Sakairi
Estimating the term…
A compact, easy-to-use device is provided which takes in a sample over a shorter distance, the sample introducing time is shortened, and contamination is prevented when the sample is introduced. A burner for generating a plasma, a deflecting portion provided with parallel electrodes for deflecting ions, and an analyzer room for performing mass separation of the deflected ions, these being disposed in a plane in the horizontal direction, and a sample setting portion for setting a sample, a peristaltic pump for aspirating the sample and the burner for introducing and burning the aspirated sample are disposed in a plane in the vertical direction relative to the aforesaid plane. The sample is supplied to the burner from below, and the ions generated by the plasma are made to flow on a horizontal plane.
A plasma ion source mass spectrometer comprising:
Dependencies are inferred from the claim text.