Double beam spectrophotometer
AssigneeShimadzu Corporation
InventorTatsumi Sato
Life of this patent
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Abstract
In a double beam spectrophotometer, a sample beam is irradiated to a large-sized sample in a substantially vertical direction, and the beam upwardly transmitted through the large-sized sample is reflected by a reflecting mirror and sent to an integrating sphere including a detector. A reference beam irradiated parallel to the sample beam is deflected by reflecting mirrors such that the reference beam goes around the large-sized sample, and guided to the integrating sphere. Thus, a holder is not required to correspond to a size or shape of the sample, and measurement position can be freely changed by moving the sample. Also, in case of utilizing a conventional standard sample chamber, movable reflecting mirrors are inserted in the optical paths to transfer the beams to the standard sample chamber.
Claims5
A double beam spectrophotometer for a sample, comprising:
- means for holding the sample in a lateral direction,
- means for providing a sample beam to one of a lower surface and an upper surface of the sample,
- a detector disposed laterally outside the means for holding the sample,
- a first reflection optical system for receiving the sample beam passing through the sample and guiding the sample beam to the detector,
- means for providing a reference beam parallel to the sample beam toward the sample holding means,
- a second reflection optical system for reflecting and guiding the reference beam to the detector without passing through the sample,
- a standard sample chamber having a reference cell and a sample cell, and
- means for selectively directing the sample beam and the reference beam supplied from the means for providing the sample beam and the reference beam to the standard sample chamber.
Dependencies are inferred from the claim text.