Apparatus and method for automatic determination of operating frequency with built-in self-test

Abstract

An apparatus automatically determines an operating frequency of an integrated circuit (IC) chip that has a built-in self-test (BIST) unit to test the chip. The apparatus includes a clock generator and a frequency determination unit. The clock generator provides a test clock to the IC chip. The frequency determination unit sets the clock generator to generate the test clock and determines the operating frequency in accordance with a test result produced from the BIST unit. The frequency determination unit also enables the BIST unit to test the IC chip. Specifically, the frequency determination unit tunes a frequency value based on the test result, and sets the clock generator to generate the test clock corresponding to the tuned frequency value. Accordingly, the apparatus determines the highest frequency passing the built-in self-test, and sets the highest frequency for the IC chip as its operating frequency.

Dependencies are inferred from the claim text.