Surface treatment of c-doped SiO2 film to enhance film stability during O2 ashing
AssigneeApplied Materials, Inc.
InventorsLi-Qun Xia, Tian-Hoe Lim, Frederic Gaillard, Ellie Yieh
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AssigneeApplied Materials, Inc.
InventorsLi-Qun Xia, Tian-Hoe Lim, Frederic Gaillard, Ellie Yieh
Estimating the term…
A method for forming an insulation layer over a substrate. The method forms a carbon-doped silicon oxide layer by thermal chemical vapor deposition using an organosilane. The carbon-doped silicon oxide layer is subsequently cured and densified. In one embodiment, the cured film is densified in a nitrogen-containing plasma. The method is particularly suitable for deposition of low dielectric constant films, i.e., where k is less than or equal to 3.0. Low-k, carbon-doped silicon oxide methylsilane or di-, tri-, tetra-, or phenylmethylsilane. and ozone. The above method can be carried out in a substrate processing system having a process chamber; a substrate holder, a heater, a gas delivery system, and a power supply, all of which are coupled to a controller. The controller contains a memory having a computer-readable medium with a program embodied for directing operation of the system in accordance with above method.
A substrate processing system comprising:
A computer readable storage medium having a computer-readable program embodied therein for directing operation of a substrate processing system including a process chamber;
Dependencies are inferred from the claim text.