Semiconductor device and method of manufacturing thereof
AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorsHiroshi Shibata, Atsuo Isobe
Life of this patent
Estimating the term…
Abstract
To provide a liquid crystal display device having high quality display by obtaining a high aperture ratio while securing a sufficient storage capacitor (Cs), and at the same time, by dispersing a load (a pixel writing-in electric current) of a capacitor wiring in a timely manner to effectively reduce the load. A scanning line is formed on a different layer from a gate electrode and the capacitor wiring is arranged so as to be parallel with a signal line. Each pixel is connected to the individually independent capacitor wiring via a dielectric. Therefore, variations in the electric potential of the capacitor wiring caused by a writing-in electric current of a neighboring pixel can be avoided, whereby obtaining satisfactory display images.
Claims80
A semiconductor device comprising:
- a first wiring on an insulating surface;
- a first insulating film on said first wiring;
- a semiconductor film on said first insulating film;
- a second insulating film on said semiconductor film;
- a second wiring, and a gate electrode which is connected to said first wiring, both formed on said second insulating film;
- a third insulating film on said second wiring and said gate electrode;
- and
- a third wiring connected to said semiconductor film over said third insulating film.
A semiconductor device comprising:
- a first wiring on an insulating surface;
- a first insulating film over said first wiring;
- a semiconductor layer over said first insulating film;
- a second insulating film on said semiconductor layer;
- a second wiring on said second insulating film;
- a gate electrode on said second insulating film, said gate electrode electrically connected to said first wiring in a pixel portion;
- a third insulating film on said second wiring and said gate electrode;
- and
- a third wiring over said third insulating film, said third wiring electrically connected to said semiconductor layer.
A semiconductor device comprising:
- a first wiring on an insulating surface;
- a first insulating film over said first wiring;
- a semiconductor layer over said first insulating film;
- a second insulating film on said semiconductor layer;
- a second wiring on said second insulating film;
- a gate electrode on said second insulating film, said gate electrode electrically connected to said first wiring in a pixel portion;
- a third insulating film on said second wiring and said gate electrode;
- and
- a third wiring over said third insulating film, said third wiring electrically connected to said semiconductor layer, and extending in parallel to said second wiring.
A semiconductor device comprising:
- a first wiring on an insulating surface;
- a first insulating film over said first wiring;
- a semiconductor layer over said first insulating film;
- a second insulating film on said semiconductor layer;
- a second wiring on said second insulating film;
- a gate electrode on said second insulating film, said gate electrode electrically connected to said first wiring in a pixel portion;
- a third insulating film on said second wiring and said gate electrode;
- a third wiring over said third insulating film, said third wiring electrically connected to said semiconductor layer;
- a fourth insulating film on said third wiring;
- and
- a light shielding layer on said fourth insulating film.
A semiconductor device comprising:
- a first wiring on an insulating surface;
- a first insulating film over said first wiring;
- a semiconductor layer over said first insulating film;
- a second insulating film on said semiconductor layer;
- a second wiring on said second insulating film;
- a gate electrode on said second insulating film, said gate electrode electrically connected to said first wiring in a pixel portion;
- a third insulating film on said second wiring and said gate electrode;
- and
- a third wiring over said third insulating film, said third wiring electrically connected to said semiconductor layer;
- a fourth insulating film over said third wiring;
- and
- a pixel electrode over said fourth insulating film, said pixel electrode electrically connected to said semiconductor layer.
The semiconductor device according to claim wherein 47, the first wiring is arranged in a direction orthogonal to the second wiring.
A semiconductor device comprising:
- a scanning line over a substrate;
- a first insulating film on said first wiring;
- a semiconductor layer on said first insulating film;
- a second insulating film on said semiconductor layer;
- a capacitor wiring on said second insulating film;
- a gate electrode on said second :insulating film, said gate electrode electrically connected to said scanning line;
- a third insulating film on said capacitor wiring and said gate electrode;
- and
- a signal line connected to said semiconductor layer over;
- said third insulating film.
A semiconductor device comprising:
- a scanning line over a substrate;
- a first insulating film on said first wiring;
- a semiconductor layer on said first insulating film;
- a second insulating film on said semiconductor layer,
- a capacitor wiring on said second insulating film;
- a gate electrode on said second insulating film, said gate electrode electrically connected to said scanning line;
- a third insulating film on said capacitor wiring and said gate electrode;
- and
- a signal line connected to said semiconductor layer over said third insulating film and extending in parallel to said capacitor wiring.
A semiconductor device comprising:
- a scanning line over a substrate;
- a first insulating film on said first wiring;
- a semiconductor layer on said first insulating film;
- a second insulating film on said semiconductor layer;
- a capacitor wiring on said second insulating film;
- a gate electrode on said second insulating film, said gate electrode electrically connected to said scanning line in a pixel portion;
- a third insulating film on said capacitor wiring and said gate electrode;
- and
- a signal line connected to, said semiconductor layer over said third insulating film.
A semiconductor device comprising:
- a scanning line over a substrate;
- a first insulating film on said first wiring;
- a semiconductor layer on said first insulating film;
- a second insulating film on said semiconductor layer;
- a capacitor wiring on said second insulating film;
- a gate electrode on, said second insulating film, said gate electrode electrically connected to said scanning line in a pixel portion;
- a third insulating film on said capacitor wiring and said gate electrode;
- and
- a signal line connected to said semiconductor layer over said third insulating film and extending in parallel to said capacitor wiring.
Dependencies are inferred from the claim text.