Soi substrate, element substrate, semiconductor device, electro-optical apparatus, electronic equipment, method of manufacturing the soi substrate, method of manufacturing the element substrate, and method of manufacturing the electro-optical apparatus
AssigneeSeiko Epson Corporation
InventorMasahiro Yasukawa
Life of this patent
Estimating the term…
Abstract
An SOI (Silicon On Insulator) substrate is provided with: a support substrate (201); a single crystal silicon layer (202) disposed above one surface of the support substrate; an insulation portion (205) disposed between the support substrate and the single crystal silicon layer, the insulation portion comprising a single layer of an insulation film or a lamination structure of a plurality of insulation films, and including a silicon nitride film or a silicon nitride oxide film (204).
Claims16
An element substrate comprising:
- a support substrate;
- a light shield film formed above said support substrate;
- an insulation portion formed above said light shield film,
- said insulation portion comprising a single layer of an insulation film or a lamination structure of a plurality of insulation films, and including a silicon nitride film or a silicon nitride oxide film;
- and
- a single crystal silicon layer disposed above said insulation portion.
An element substrate including a transistor element and a semiconductor substrate,
- said semiconductor substrate comprising:
- a support substrate;
- a light shield film formed above said support substrate, at least overlapped with a channel region of said transistor element;
- an insulation portion formed above said light shield film,
- said insulation portion comprising a single layer of an insulation film or a lamination structure of a plurality of insulation films, and including a silicon nitride film or a silicon nitride oxide film;
- and
- a single crystal silicon layer disposed above said insulation portion,
- said transistor element including a semiconductor layer comprising said single crystal silicon layer.
An electro-optical apparatus comprising
- (A) an element substrate including a transistor element and a semiconductor substrate,
- said semiconductor substrate comprising:
- a support substrate;
- a light shield film formed above said support substrate, at least overlapped with a channel region of said transistor element;
- an insulation portion formed above said light shield film,
- said insulation portion comprising a single layer of an insulation film or a lamination structure of a plurality of insulation films, and including a silicon nitride film or a silicon nitride oxide film;
- and
- a single crystal silicon layer disposed above said insulation portion,
- said transistor element including a semiconductor layer comprising said single crystal silicon layer,
- (B) another substrate opposed to a plane, on which said transistor element is formed, of said element substrate, and
- (C) an electro-optical material layer disposed between said element substrate and said another substrate.
An electronic equipment having an electro-optical apparatus comprising
- (A) an element substrate including a transistor element and a semiconductor substrate,
- said semiconductor substrate comprising:
- a support substrate;
- a light shield film formed above said support substrate, at least overlapped with a channel region of said transistor element;
- an insulation portion formed above said light shield film,
- said insulation portion comprising a single layer of an insulation film or a lamination structure of a plurality of insulation films, and including a silicon nitride film or a silicon nitride oxide film;
- and
- a single crystal silicon layer disposed above said insulation portion,
- said transistor element including a semiconductor layer comprising said single crystal silicon layer,
- (B) another substrate opposed to a plane, on which said transistor element is formed, of said element substrate, and
- (C) an electro-optical material layer disposed between said element substrate and said another substrate.
A semiconductor device including a transistor element and a semiconductor substrate,
- (A) said semiconductor substrate comprising:
- a support substrate;
- a light shield film formed above said support substrate, at least overlapped with a channel region of said transistor element;
- an insulation portion formed above said light shield film,
- said insulation portion comprising a single layer of an insulation film or a lamination structure of a plurality of insulation films, and including a silicon nitride film or a silicon nitride oxide film;
- and
- (B) said transistor element including (i) a semiconductor layer comprising said single crystal silicon layer and (ii) an electrically conductive member disposed at one side of said insulation portion opposite said transistor element.
An electronic equipment having a semiconductor device including a transistor element and a semiconductor substrate,
- (A) said semiconductor substrate comprising:
- a support substrate;
- a light shield film formed above said support substrate, at least overlapped with a channel region of said transistor element;
- an insulation portion formed above said light shield film,
- said insulation portion comprising a single layer of an insulation film or a lamination structure of a plurality of insulation films, and including a silicon nitride film or a silicon nitride oxide film;
- and
- a single crystal silicon layer disposed above said insulation portion,
- (B) said transistor element including (i) a semiconductor layer comprising said single crystal silicon layer and (ii) an electrically conductive member disposed at one side of said insulation portion opposite said transistor element.
Dependencies are inferred from the claim text.