Scanning tunneling charge transfer microscope

A probe for a scanning probe microscope comprising:

• a conductive cantilever having a conductive tip;
• an insulating layer over the conductive tip;
• and
• a metallic dot over the insulating layer.

A system for a scanning probe microscope containing a tip comprising:

• a conductive tip;
• an insulating layer over the conductive tip;
• and
• a metallic dot over the insulating layer.

A method for making a tip for a scanning probe microscope, comprising:

• providing a cantilever with a conductive tip thereon;
• providing an insulating layer on the conductive tip;
• providing a metal layer on the insulating layer;
• and
• removing a portion of the metal layer, leaving a metal tip on the apex of the insulated conductive tip.

A method for making a tip for a scanning probe microscope, comprising:

• providing a cantilever with an insulated tip thereon;
• providing a masking layer on the insulated tip;
• removing a portion of the masking layer, thereby exposing the apex of the insulated tip,
• providing a metal layer on the apex of the insulated tip and the masking layer;
• and
• removing the remaining masking layer and the metal layer overlying the masking layer.

A method for using a scanning probe microscope, comprising:

• providing a scanning probe microscope containing a tip, the tip comprising a conductive tip, an insulating layer over the conductive tip, and a metallic dot over the insulating layer;
• providing a surface to be analyzed;
• and
• using the scanning probe microscope to measure the transfer of an amount of charge or current to or from the surface.

A method for using a scanning probe microscope, comprising:

• providing a scanning probe microscope containing a tip, the tip comprising an insulated tip and a metallic dot over the insulated tip;
• providing a surface to be analyzed;
• and
• using the scanning probe microscope to measure the transfer of an electronic charge to or from the surface.

A method for using a scanning probe microscope, comprising:

• providing a scanning probe microscope containing a tip, the tip comprising a conductive tip, an insulating layer over the conductive tip, and a metallic dot over the insulating layer;
• providing a surface to be analyzed;
• and
• using the scanning probe microscope for spectroscopic measurements.

A scanning probe microscope, comprising:

• a cantilever containing a tip;
• an insulated transistor electrically connected to means for measuring resistance;
• and
• a metallic dot over the insulated transistor.