Method of and system for scanning bar code symbols using a laser scanning pattern having multiple focal zones, wherein the minimum beam dimension/minimum bar width (mbd/mbw) ratio is greater than or equal to 2.0
AssigneeMetrologic Instruments, Inc.
InventorsMark Lucera, Frank Check, C. Harry Knowles, Xiaoxun Zhu, LeRoy Dickson
Life of this patent
Estimating the term…