Cell architecture to reduce customization in a semiconductor device
AssigneeViASIC, Inc.
InventorWilliam D. Cox
Life of this patent
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Abstract
A semiconductor device and method of testing the device having a plurality of logic cells interconnected using vias to connect routing tracks that are disposed among a plurality of layers in the device. The logic cells in the device including at least two three-input look-up tables, one two-input look-up table and a flip-flop. The components in the logic cell are connected so that any look-up table can drive at least one input of any other look-up table and where the flip-flop is connected to the look-up tables so that any look-up table can drive an input of the flip-flop.
Claims14
A semiconductor device comprising:
- a plurality of logic cells interconnected using via connections between routing tracks that are disposed among a plurality of layers, wherein said logic cells comprise:
- at least two three-input look-up tables;
- at least one two-input look-up table;
- a flip-flop;
- and
- wherein the look-up tables are interconnected so that any one look-up table can drive at least one input of at least one other look-up table and the flip-flop is connected to the look-up tables so that any look-up table can drive an input of the flip-flop.
A method of making a semiconductor device, the method comprising:
- forming a semiconductor layer comprising a mask-configurable gate array having logic cells that include at least two three-input look-up tables, at least one two-input look-up table and a flip-flop, wherein the look-up tables are interconnected so that any one look-up table can drive at least one input of at least one other look-up table and the flip-flop is connected to the look-up tables so that any look-up table can drive an input of the flip-flop;
- and
- forming a plurality of metal layers disposed on top of the semiconductor layer for routing connections wherein at least some of the plurality of metal layers configures the gate array logic cells.
Dependencies are inferred from the claim text.