Apparatus for measuring high frequency currents
AssigneesFlorida International University, The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
InventorsMark J. Hagmann, John F. Sutton
Life of this patent
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Abstract
An apparatus for measuring high frequency currents includes a non-ferrous core current probe that is coupled to a wide-band transimpedance amplifier. The current probe has a secondary winding with a winding resistance that is substantially smaller than the reactance of the winding. The sensitivity of the current probe is substantially flat over a wide band of frequencies. The apparatus is particularly useful for measuring exposure of humans to radio frequency currents.
Claims25
Apparatus for measuring high frequency currents flowing through an object, comprising:
- a non-ferrous core current probe having a secondary winding with a secondary winding resistance and a secondary winding reactance such that the secondary winding resistance is substantially smaller than the secondary winding reactance from a low operative frequency to a high operative frequency;
- and
- a wide-band transimpedance amplifier circuit coupled to the secondary winding and adapted to amplify currents provided by the secondary winding so that the sensitivity of the current probe is substantially flat from the low operative frequency to the high operative frequency.
Dependencies are inferred from the claim text.