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US 6,559,818 B1Granted
Method of testing addressable emissive cathodes
AssigneeMicron Technology, Inc.
InventorJim Browning
Life of this patent
Estimating the term…
Abstract
A method for determining functionality of pixels comprising the addressing of at least one but not more than ten pixels at a time, thereby producing a current. The pixels are comprised of cathode emitters. The current is collected on an anode disposed opposite the pixels, and the current is measured.
Claims28
A method for testing at least a portion of a field emission display, comprising:
- providing a screen anode, the screen anode at least partially disposed within a display segment of the field emission display;
- providing a pixel;
- generating a potential difference between the screen anode and the pixel;
- emitting electrons from the pixel in at least partial response to the potential difference;
- at the screen anode, collecting at least a substantial portion of the electrons emitted;
- providing the electrons collected as a current pulse;
- measuring the current pulse;
- and
- comparing the measured value to a known value to determine functionality of the pixels.
6 more elements
A method for testing field emission for a field emission display, comprising:
- providing pixels, each of the pixels having a plurality of cathode emitters;
- providing a screen anode, the screen anode at least partially disposed within a display segment;
- selecting a first portion of the pixels;
- applying a voltage to the screen anode and the first portion;
- generating a first emission from the first portion at least in partial response to the voltage applied;
- at the screen anode, collecting electrons of the first emission to provide a first current pulse;
- measuring the first current pulse;
- and
- comparing the measured value to a known value to determine functionality of the first portion of the pixels.
6 more elements
A method for testing at least a portion of a field emission display, comprising:
- providing pixels, each of the pixels having a plurality of cathode emitters;
- providing a screen anode, the screen anode at least partially disposed within a display segment;
- accessing a subset of the pixels, the subset including more than one of the pixels;
- selecting a first pixel and a second pixel of the subset;
- applying voltage to all but the first pixel of the subset to emit electrons from a first remainder of the pixels;
- applying voltage to all but the second pixel of the subset to emit electrons from a second remainder of the pixels;
- at the screen anode, respectively collecting electrons emitted from the first remainder and the second remainder;
- and
- measuring the electrons collected as respective current pulses.
6 more elements
A method for testing field emission of a field emission display, comprising:
- providing a first anode, the first anode at least partially disposed within a display segment;
- providing a second anode, the second anode at least partially disposed within the display segment;
- providing pixels, each of the pixels having a plurality of cathode emitters;
- selecting a first portion of the pixels;
- applying a bias voltage to the first portion to provide a first electron emission;
- collecting at least a portion of the first electron emission at the first anode;
- providing a first photon emission to the second anode in response to the collection of the first electron emission;
- and
- measuring the first photon emission as a first pulse, the first pulse indicative of the field emission of the first portion of pixels.
6 more elements
A method of testing at least a portion of a field emission display, comprising:
- applying a potential difference to a pixel of the display for a determined period of time to cause an emission of electrons in the pixel;
- measuring a current pulse created by the emission of electrons;
- comparing at least one parameter of the measured current pulse to at least one parameter of a known current pulse to determine the functionality of the pixel;
- and
- repeating the method on another pixel of the display after a predetermined time delay, wherein the predetermined period of time for applying the potential difference is about 100 μsec.
2 more elements
A method of testing at least a portion of a field emission display, comprising:
- applying a potential difference to a pixeel of the display for a predetermined period of time to cause an emission of electrons in the pixel;
- measuring a current pulse created by the emission of electrons;
- comparing at least one parameter of the measured current pulse to at least one parameter of a known current pulse to determine the functionality of the pixel;
- and
- repeating the method on another pixel of the display after a predetermined time delay, wherein the predetermined time delay is about 100 μsec.
2 more elements
A method of testing at least a portion of a field emission display, comprising:
- applying a potential difference to a pixel of the display for a predetermined period of time to cause an emission of electrons in the pixel;
- measuring a current pulse created by the emission of electrons;
- comparing at least one parameter of the measured current pulse to at least one parameter of a known current pulse to determine the functionality of the pixel;
- and
- repeating the method on another pixel of the display after a predetermined time delay, wherein the predetermined period of time for applying the potential difference combined with the predetermined time delay is about 10 μsec to about 10 msec.
2 more elements
A method for testing at least a portion of a field emission display, comprising:
- applying a potential difference to a first set of pixel of the display to cause an emission of electrons in the first set of pixels;
- measuring a first current value resulting from the emission of electrons in the first set of pixels;
- applying the potential difference to a second set of pixels of the display to cause an emission of electrons in the second set of pixels;
- measuring a second current value resulting from the emission of electrons in the second set of pixels;
- and
- comparing the first current value and the second current value to at least one of each other and a known value.
3 more elements
A method for testing at least a portion of a field emission display, comprising:
- applying a potential difference to a first set of pixels of the display to cause an emission of photons from the first set of pixels;
- measuring at least one parameter characteristic of the emission of photons from the first set of pixels;
- applying the potential difference to a second set of pixels of the display to cause an emission of photons from the second set of pixels;
- measuring at least one parameter characteristic of the emission of photons from the second set of pixels;
- and
- comparing the at least one parameter from the first set of pixels and the at least one parameter from the second set of pixels, to at least one of, each other and a known value.
3 more elements
Dependencies are inferred from the claim text.