Systems and methods for facilitating automated test equipment functionality within integrated circuits
AssigneeAgilent Technologies, Inc.
InventorsJohn G. Rohrbaugh, Jeffrey R. Rearick, Shad R. Shepston
Life of this patent
Estimating the term…
Abstract
A preferred system for facilitating automated test equipment functionality within integrated circuits includes automated test equipment (ATE) configured to electrically interconnect with an integrated circuit and to provide at least one signal to the integrated circuit. A first parametric test circuit, internal to the integrated circuit, also is provided. The first parametric test circuit is adapted to electrically communicate with the automated test equipment so that, in response to receiving a signal from the automated test equipment, the first parametric test circuit measures at least one parameter of a first pad of the integrated circuit.
Claims30
A method for testing an integrated circuit (IC), the IC having a first pad and a first parametric test circuit, the first pad being configured as a signal interface for components external to the IC, the first parametric test circuit being internal to the IC and being adapted to test at least one parameter of the IC, said method comprising the steps of:
- electrically interconnecting automated test equipment (ATE) with the IC;
- providing at least one stimulus from the ATE to the IC such that the first parametric test circuit measures at least one parameter of the first pad;
- and
- receiving information corresponding to the at least one parameter measured by the first parametric test circuit,
- wherein the ATE has a first operating frequency and the IC has a plurality of pads and a plurality of parametric test circuits, and
- wherein the step of providing at least one stimulus comprises the step of measuring, by the plurality of parametric test circuits, parameters of the plurality of pads at a frequency higher than the first operating frequency of the ATE.
A method for testing an integrated circuit (IC), the IC having a first pad and a first parametric test circuit, the first pad being configured as a signal interface for components external to the IC, the first parametric test circuit being internal to the IC and being adapted to test at least one parameter of the IC, said method comprising the steps of:
- electrically interconnecting automated test equipment (ATE) with the IC;
- providing at least one stimulus from the ATE to the IC such that the first parametric test circuit measures at least one parameter of the first pad;
- and
- receiving information corresponding to the at least one parameter measured by the first parametric test circuit,
- wherein the step of providing at least one stimulus comprises the steps of:
- measuring a first parameter of the first pad by the ATE;
- and
- measuring the first parameter of the first pad by the first parametric test
- circuit, and
- further comprising the steps of:
- receiving information corresponding to the first parameter measured by the ATE;
- receiving information corresponding to the first parameter measured by the first parametric test circuit;
- and
- comparing the information corresponding to the first parameter measured by the ATE to the information corresponding to the first parameter measured by the first parametric test circuit.
An integrated circuit (IC) configured for testing by automated test equipment (ATE), the ATE having a first operating frequency, said IC comprising:
- a first pad electrically communicating with at least a portion of the IC, said first pad being configured as a signal interface for components external to said IC;
- and
- a first parametric test circuit internal to said IC and being adapted to measure at least one parameter of said first pad at a frequency higher than the first operating frequency of the ATE.
A system for measuring a parameter of a pad of an integrated circuit (IC), the IC having a first pad electrically communicating with at least a portion of the IC and being configured to interface with components external to the IC, said system comprising:
- automated test equipment (ATE) configured to electrically interconnect with the IC and to provide at least one signal to the IC, the ATE having a first operating frequency;
- and
- a first parametric test circuit internal to the IC and being adapted to electrically communicate with said ATE such that, in response to receiving said at least one signal from said ATE, said first parametric test circuit measures at least one parameter of the first pad at a frequency higher than the first operating frequency of the ATE.
Dependencies are inferred from the claim text.